PRAXIS—combined μ-Raman and μ-XRF spectrometers in the examination of forensic samples

Στο καινούργιο τευχος του Journal of Forensic Sciences International (Volume 175, Issue 1, 25 February 2008, Pages 1-10 ), οι Janina Zieba-Palus,Rafał Borusiewicz & Marcin Kunicki παρουσιάζουν μια εργασία με τίτλο: "PRAXIS—combined μ-Raman and μ-XRF spectrometers in the examination of forensic samples".

In the new Issue of Journal of Forensic Sciences International (Volume 175, Issue 1, 25 February 2008, Pages 1-10 ), Janina Zieba-Palus,Rafał Borusiewicz & Marcin Kunicki present a paper titled: "PRAXIS—combined μ-Raman and μ-XRF spectrometers in the examination of forensic samples".

Περίληψη/Abstract:

Recently, two analytical techniques – Raman and XRF spectroscopy – have been often applied in criminalistic examinations of different kinds of trace evidences. In this paper, the application of the new combined μ-Raman and μ-XRF spectrometer in analysis of multilayer paint chips, modern inks, plastics and fibres was evaluated. It was ascertained that the apparatus possesses real advantages and could be helpful in the identification of examined materials after some modifications, i.e. by adding an extra laser and decreasing the spot size of the X-ray beam.