Στο καινούργιο τευχος του Forensic Science International (Volume 178, Issue 1, Pages 1-82 (10 June 2008)), ο Shigeru Sugawara παρουσιάζει μια εργασία με τίτλο: "Passport examination by a confocal-type laser profile microscope "
In the new Issue of Forensic Science International (Volume 178, Issue 1, Pages 1-82 (10 June 2008)), Shigeru Sugawara present a paper titled:"Passport examination by a confocal-type laser profile microscope "
Περίληψη/Abstract: The author proposes a nondestructive and highly precise method of measuring the thickness of a film pasted on a passport using a confocal-type laser profile microscope. The effectiveness of this method in passport examination is demonstrated. A confocal-type laser profile microscope is used to create profiles of the film surface and film–paper interface; these profiles are used to calculate the film thickness by employing an algorithm developed by the author. The film thicknesses of the passport samples—35 genuine and 80 counterfeit Japanese passports—are measured nondestructively. The intra-sample standard deviation of the film thicknesses of the genuine and counterfeit Japanese passports was of the order of 1 μm The intersample standard deviations of the film thicknesses of passports forged using the same tools and techniques are expected to be of the order of 1 μm. The thickness values of the films on the machine-readable genuine passports ranged between 31.95 μm and 36.95 μm. The likelihood ratio of this method in the authentication of machine-readable Japanese genuine passports is 11.7. Therefore, this method is effective for the authentification of genuine passports. Since the distribution of the film thickness of all forged passports was considerably larger than the accuracy of this method, this method is considered effective also for revealing the relation among the forged passports and acquiring proof of the crime.
http://dx.doi.org/10.1016/j.forsciint.2008.02.004
